Radiation-Hardness Components at Scaled Technology Nodes (UTBB FDSOI28) – Test of Single-Events Effects in ARM Cores
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چکیده
This study aims to investigate radiation-hardness aspects such as Single-Event Effects (SEE) for electronic components at scaled technology nodes using UTBB FDSOI 28nm. In particular, system test of this technology for ARM processor cores with several strategies of radiation-hardness by design is aimed at. Results and design strategies would be important deliverables of the project regarding an assessment of this technology for reliable electronic components for space applications.
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